Simulación y análisis de impedancia de capas de nano esferas aislantes para micro almacenamiento de carga eléctrica

Abstract

The main objective of this Scientific Article was the analysis, comparison, and simulation of impedance spectroscopy of four MIM capacitors, the first one with a continuous insulation layer composed of silicon oxide, located in the middle of the electrodes, the 3 remaining MIM simulations have a discontinuous insulating layer of nanospheres composed of the same component silicon oxide as the dielectric material. These nanospheres have a variable radius with respect to the number of layers used as dielectric, all this in order to maintain a dielectric thickness of 1.2 micrometers in all cases.